Search Results

  • Fringe pattern characterization by OPD analysis in a lateral shearing interferometric profilometer [2011]

    Category:
    Artículos
    Authors:
    Silvia Rodríguez Jiménez , Ignacio Álvarez García , José María Enguita González , María Frade Rodríguez
    Date:
    01 of January of 2011
    It Is a Part of:
    Optical Measurement Systems for Industrial Inspection Vii