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Fringe pattern characterization by OPD analysis in a lateral shearing interferometric profilometer [2011]
- Category:
- Artículos
- Authors:
- Silvia Rodríguez Jiménez , Ignacio Álvarez García , José María Enguita González , María Frade Rodríguez
- Date:
- 01 of January of 2011
- It Is a Part of:
- Optical Measurement Systems for Industrial Inspection Vii