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  • In-Situ Waviness Characterization of Metal Plates by a Lateral Shearing Interferometric Profilometer [2013]

    Category:
    Artículos
    Authors:
    María Frade Rodríguez , José María Enguita González , Ignacio Álvarez García
    Date:
    01 of January of 2013
    It Is a Part of:
    Sensors