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  • Fringe pattern characterization by OPD analysis in a lateral shearing interferometric profilometer [2011]

    Category:
    Artículos
    Authors:
    María Frade Rodríguez , Ignacio Álvarez García , Silvia Rodríguez Jiménez , José María Enguita González
    Date:
    01 of January of 2011
    It Is a Part of:
    Optical Measurement Systems for Industrial Inspection Vii