Search Results

  • Common-path two-wavelength interferometer with submicron precision for profile measurements in on-line applications [2010]

    Category:
    Artículos
    Authors:
    María Frade Rodríguez , Ignacio Álvarez García , Jorge Marina Juárez , José María Enguita González
    Date:
    01 of January of 2010
    It Is a Part of:
    Optical Engineering