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  • Common-path two-wavelength interferometer with submicron precision for profile measurements in on-line applications [2010]

    Category:
    Artículos
    Authors:
    José María Enguita González , Ignacio Álvarez García , Jorge Marina Juárez , María Frade Rodríguez
    Date:
    01 of January of 2010
    It Is a Part of:
    Optical Engineering